IBM researchers drive SRAM speed to 6GHz》及本站其它信息均来自网络!
行业新闻技术文章解决方案电路图产品库厂商库供应信息求购信息外刊文摘
 技术文章 -> PCB电源单片机DSP设备与仪器EDA放大/转换存储器嵌入式接口与连接通讯与网络模拟技术其它技术文章
 解决方案 -> 汽车电子光电与显示测试测量计算机与外设仪器仪表通讯与网络视像设备消费电子工业控制其它解决方案
 产 品 库 -> 存储器嵌入式单片机电源通讯网络接口电路DSP视频音频EDA/PLD显示光电电测仪表传感与控制其它产品
 首页 -> 外刊文摘 -> 正文

IBM researchers drive SRAM speed to 6GHz

At the last VLSI Circuits Symposium in Kyoto, Japan, IBM scientists unveiled a prototype embedded SRAM chipset capable of reaching speeds beyond 6GHz. Their accomplishment is nearly twice as fast as the SRAMs available today.

Embedded SRAMs hold data that is frequently accessed by the processor. The faster the access, the faster the data transfer from SRAM to CPU. "As the technology reduces electronic dimensions to achieve higher densities and to follow Moore’s Law, variability in processes that produce electronic devices makes this task increasingly difficult," said Rajiv Joshi, research staff member at IBM’s T. J. Watson research center.

Overcoming variations
Researchers have been looking for ways to overcome the effects of process variability, especially variations in the device turn-on characteristics when a device is placed in a sea of devices. Those variations can make memories lose stored data, rendering them "unstable."

Different techniques have been proposed to improve the stability of SRAM cells, such as dynamic or dual-cell power supplies based on read or write operations, or adding more transistors to a six-transistor SRAM cell.

IBM researchers have demonstrated a novel hardware-based solution to eliminate "half select" problems, improve Vmin and increase performance for multiport applications by using 8T SRAM arrays.

Half-select occurs when word line is on while column select is off, which leads to poor stability. A novel write-byte concept generates local-write word lines, which are only selected when the write control for the selected block is on, avoiding half-select disturb conditions. Thus, the separate read port eliminates half-select during read, and write byte eliminates half-select during write.

Edge-capture circuit
An on-chip edge-capture circuit has been used for the first time to measure chip-internal signal parameters, such as word-line pulse width, and to calibrate the SRAM cell performance.

On-chip pulse characterization techniques show that tiny pulses, on the order of 50-60ps wide, can be measured to accurately determine how fast the SRAM cells can function. "This can definitely show that, indeed, the storage element is capable of functioning at a speed of 6.6-plus GHz," said Joshi.

The chip was fabricated in a 65nm silicon-on-insulator process, part of Joshi’s research at IBM. He has been instrumental in developing novel interconnect processes and structures for aluminum, tungsten and copper technologies used in IBM processes. He holds 114 U.S. patents, in addition to several pending patents, and is an IEEE fellow.

(()
Google
 >> 最近更新
 • Qualcomm says it won''t rock 3G boat
 • China''s Huawei also gets VimpelCom''s offer
 • A million-dollar arm--no kidding
 • Ciranova plans to donate p-cell tech to Si2
 • Intel, AMD respin server chips for virtualiz
 • China digital STB maker picks Freescale sili
 • Intel invests $218.5 in virtualization solut
 • Microsoft cooks up ’smaller, quieter’ Xbox
 • IBM researchers drive SRAM speed to 6GHz
 • China mobile TV spec gains strong backers
 • Intel joins OLPC project
 • China MII releases 3G videophone standard
 • Startup brews ’perfect storm’ for R&D(英)
 • ADI, TSMC bring 65nm tech into baseband proc
 • Othello chip suits 3G TD-SCDMA wireless hand
 • ADI, TSMC bring 65nm tech into baseband proc
 • IEEE 802.20 working group revises voting pro
 • Sony in new power pack recall
 • IEEE plots road map for 40/100Gbps Ethernet
 • TI, Ericsson develop solutions for Open OS 3
Copyright © 2005-2008 555DZ.com 联系站长:55dz@163.com